1
|
KWEO123040070803
|
EDGE/NOTCH/BACK FRONT INSPECTION SYSTEM (9031.41)
|
S E H AMERICA. INC. (M/S65 2-396)
|
NANOSYSTEM SOLUTIONS, INC.
|
2025-07-24
|
Japan
|
2786 Kgs
|
3 CAS
|
2
|
KWEO123049964360
|
TWIN DEFECT INSPECTION SYSTEM (9031.41)
|
S E H AMERICA. INC. (M/S65 2-396)
|
NANOSYSTEM SOLUTIONS, INC.
|
2025-02-23
|
Japan
|
2369 Kgs
|
3 CAS
|
3
|
KWEO123049330845
|
SIFTER300 PARTS ROBOT (8479.50)
|
S E H AMERICA. INC. (M/S65 2-396)
|
NANO SYSTEM SOLUTIONS, INC.
|
2024-04-15
|
Japan
|
58 Kgs
|
1 CTN
|
4
|
KWEO123049330370
|
ADDITIONAL PARTS (8525.89)
|
S E H AMERICA. INC. (M/S65 2-396)
|
NANOSYSTEM SOLUTIONS, INC.
|
2024-03-25
|
Japan
|
226 Kgs
|
1 CAS
|
5
|
KWEO123047998060
|
HIGH SENSITIVITY PH INSPECTION UNIT FOR UPGRADE FOR SIFTER310 (9031.90)
|
S E H AMERICA. INC. (M/S65 2-396)
|
NANO SYSTEM SOLUTIONS, INC.
|
2023-08-13
|
Japan
|
427 Kgs
|
20 CTN
|
6
|
KWEO123047967352
|
EDGE (9031.41)
|
S E H AMERICA. INC. (M/S65 2-396)
|
NANO SYSTEM SOLUTIONS, INC.
|
2023-06-04
|
Japan
|
2632 Kgs
|
3 CAS
|
7
|
KWEO114043805001
|
WAFER EDGEAND BACKSIDE/PINHOLE DEFECT INSPECTION COMBINATION (9031.41)
|
S E H AMERICA. INC. (M/S65 2-396)
|
NANOSYSTEM SOLUTIONS, INC.
|
2020-07-27
|
China Taiwan
|
2270 Kgs
|
1 CAS
|
8
|
KWEO114043804975
|
SILICON WAFER (3818.00)
|
S E H AMERICA. INC. (M/S65 2-396)
|
NANOSYSTEM SOLUTIONS, INC.
|
2020-06-16
|
China Taiwan
|
2420 Kgs
|
2 CAS
|